Semiconductor device and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE21664, C438S396000

Reexamination Certificate

active

08044447

ABSTRACT:
There is provided a semiconductor device including a silicon substrate, a source/drain region formed in a surface layer of the silicon substrate, a first insulating film provided with a first hole on the first source/drain region, a conductive film formed on an inner surface of the first hole, a filler body, which is formed with a thickness to fill the first hole on the first conductive film, forms a first conduct plug together with the conductive film, and is formed of an insulating material with an upper surface being amorphous, and a capacitor, which is formed on the first contact plug and is provided with a lower electrode electrically connected to the conductive film, a capacitor dielectric film formed of a ferroelectric material, and an upper electrode.

REFERENCES:
patent: 6144052 (2000-11-01), Kushida et al.
patent: 6744092 (2004-06-01), Kweon
patent: 7176132 (2007-02-01), Sashida et al.
patent: 7268472 (2007-09-01), Higuchi et al.
patent: 2003/0047771 (2003-03-01), Kweon et al.
patent: 2003/0054634 (2003-03-01), Lee et al.
patent: 2003/0162401 (2003-08-01), Kikuchi et al.
patent: 2001-345432 (2001-12-01), None
patent: 2003-31775 (2003-01-01), None
patent: 2003-133534 (2003-05-01), None
patent: 2003-258203 (2003-09-01), None
patent: 2004-153031 (2004-05-01), None
patent: 2004-193430 (2004-07-01), None
patent: 2004-207692 (2004-07-01), None
patent: 97/33316 (1997-09-01), None
Chinese Office Action dated Aug. 4, 2010, issued in corresponding Chinese Patent Application No. 2005-800513196.
International Search Report of PCT/JP2005/014930, date of mailing Oct. 25, 2005.

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