Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers
Reexamination Certificate
2009-02-11
2010-10-19
Nhu, David (Department: 2895)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Multiple layers
C438S774000, C438S914000, C257SE21006, C257SE21054, C257SE21170, C257SE21152, C257SE21248, C257SE21267, C257SE21278, C257SE21293, C257SE21311, C257SE21318, C257SE21304
Reexamination Certificate
active
07816279
ABSTRACT:
A semiconductor device includes a first conductor disposed on a semiconductor substrate; an oxygen-containing insulation film disposed on the semiconductor substrate and on the first conductor, the insulation film having a contact hole which extends to the first conductor and a trench which is connected to an upper portion of the contact hole; a zirconium oxide film disposed on a side surface of the contact hole and a side surface and a bottom surface of the trench; a zirconium film disposed on the zirconium oxide film inside the contact hole and inside the trench; and a second conductor composed of Cu embedded into the contact hole and into the trench.
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Nakao Yoshiyuki
Shimizu Noriyoshi
Sunayama Michie
Fujitsu Semiconductor Limited
Nhu David
Westerman Hattori Daniels & Adrian LLP
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