Semiconductor device and method for manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S213000, C257S361000, C438S253000

Reexamination Certificate

active

07553722

ABSTRACT:
A semiconductor device includes: a semiconductor substrate having a first surface and a second surface, wherein the substrate has a first conductive type; a first trench extending from the first surface of the semiconductor substrate in a depth direction; and an epitaxial semiconductor layer having a second conductive type, wherein the epitaxial semiconductor layer is disposed in the first trench. The first trench includes an inner wall as an interface between the semiconductor substrate and the epitaxial semiconductor layer so that the interface provides a PN junction. The first trench has an aspect ratio equal to or larger than 1.

REFERENCES:
patent: 5751022 (1998-05-01), Yasuhara et al.
patent: 6365932 (2002-04-01), Kouno et al.
patent: 6525375 (2003-02-01), Yamaguchi et al.
patent: 6630389 (2003-10-01), Shibata et al.
patent: 6696323 (2004-02-01), Yamaguchi et al.
patent: 2003/0139012 (2003-07-01), Yamauchi et al.

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