Semiconductor device and method for manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Reexamination Certificate

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C438S154000, C257S071000

Reexamination Certificate

active

10963822

ABSTRACT:
A semiconductor device that can be manufactured with a reduced cost by decreasing the number of masks is disclosed, and a method for manufacturing the semiconductor device is disclosed. The method for manufacturing the semiconductor device comprises the steps of: forming a semiconductor layer3having a source and a drain regions10, 11, and LDD regions16, 17; a gate insulating film5; and a gate electrode6; forming a first and a second interlayer insulating films24, 25over the gate electrode6and the gate insulating film5; forming contact holes25a,25cto these interlayer insulating films so as to be located over each of the source region and the drain region; and an opening portion25bto these interlayer insulating films so as to be located over the gate electrode and the LDD region; forming a second gate electrode26bby a conductive film in the opening portion so as to cover the gate electrode and the LDD region; and a pixel electrode26aover the second interlayer insulating film; removing the gate insulating film in the contact hole; and forming wirings27, 28connected to each the source region and the drain region.

REFERENCES:
patent: 5814529 (1998-09-01), Zhang
patent: 6320224 (2001-11-01), Zhang
patent: 6593592 (2003-07-01), Yamazaki et al.
patent: 6639265 (2003-10-01), Arao et al.
patent: 2001/0009283 (2001-07-01), Arao et al.
patent: 2002/0055206 (2002-05-01), Zhang
patent: 2004/0056296 (2004-03-01), Arao et al.
patent: 06-013407 (1994-01-01), None
patent: 06-260645 (1994-09-01), None
patent: 11-097714 (1999-04-01), None
patent: 2001-290171 (2001-10-01), None

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