Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-03-08
2005-03-08
Whitehead, Jr., Carl (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S268000
Reexamination Certificate
active
06864532
ABSTRACT:
A trench-gate type transistor has a gate insulating film formed on an inner wall of a trench. The gate insulating film includes a first portion located on a wall of the trench and a second portion located on upper and bottom portions of the trench. The first portion includes a first oxide film, a nitride film, and a second oxide film. The second portion includes only an oxide film and is thicker than the first portion. Accordingly, electric field concentration on upper and lower corner portions of the trench can be reduced to improve the withstand voltage. In addition, and end of the trench may have an insulation layer that is thicker than the first portion.
REFERENCES:
patent: 4693781 (1987-09-01), Leung et al.
patent: 4839306 (1989-06-01), Wakamatsu
patent: 4954854 (1990-09-01), Dhong et al.
patent: 5236861 (1993-08-01), Otsu
patent: 5321289 (1994-06-01), Baba et al.
patent: 5442214 (1995-08-01), Yang
patent: 5723891 (1998-03-01), Malhi
patent: 5726088 (1998-03-01), Yanagiya et al.
patent: 5795792 (1998-08-01), Nishihara
patent: 5877527 (1999-03-01), Okabe et al.
patent: 5891807 (1999-04-01), Muller et al.
patent: 5915180 (1999-06-01), Hara et al.
patent: 6114207 (2000-09-01), Okabe et al.
patent: 6147378 (2000-11-01), Liu et al.
patent: 6201278 (2001-03-01), Gardner et al.
patent: 6278155 (2001-08-01), Okabe et al.
patent: 6316807 (2001-11-01), Fujishima et al.
patent: 6372567 (2002-04-01), Tews et al.
patent: 6404007 (2002-06-01), Mo et al.
patent: 6686625 (2004-02-01), Tihanyi
patent: 20010008291 (2001-07-01), Aoki et al.
patent: 0684637 (1995-11-01), None
patent: A-60-68650 (1985-04-01), None
patent: A-60-158642 (1985-08-01), None
patent: A-6-219759 (1985-11-01), None
patent: A-61-119056 (1986-06-01), None
patent: A-62-73737 (1987-04-01), None
patent: A-62-136065 (1987-06-01), None
patent: A-62-160731 (1987-07-01), None
patent: A-62-185353 (1987-08-01), None
patent: A-62-293661 (1987-12-01), None
patent: A-63-2371 (1988-01-01), None
patent: A-63-115358 (1988-05-01), None
patent: A-63-166230 (1988-07-01), None
patent: A-63-229743 (1988-09-01), None
patent: A-63-229845 (1988-09-01), None
patent: A-63-278338 (1988-11-01), None
patent: A-63-318768 (1988-12-01), None
patent: A-1-196134 (1989-08-01), None
patent: A-1-216538 (1989-08-01), None
patent: A-2-3956 (1990-01-01), None
patent: A-2-54557 (1990-02-01), None
patent: A-2-260424 (1990-10-01), None
patent: A-2-260660 (1990-10-01), None
patent: A-2-271618 (1990-11-01), None
patent: A-2-271619 (1990-11-01), None
patent: A-2-271620 (1990-11-01), None
patent: A-3-147327 (1991-06-01), None
patent: A-3-252131 (1991-11-01), None
patent: A-4-37152 (1992-02-01), None
patent: A-5-55361 (1993-03-01), None
patent: A-5-102297 (1993-04-01), None
patent: A-5-226298 (1993-09-01), None
patent: B2-5-75184 (1993-10-01), None
patent: B2-6-18248 (1994-03-01), None
patent: B2-6-24228 (1994-03-01), None
patent: B2-7-48547 (1995-05-01), None
patent: B2-2519474 (1996-05-01), None
patent: A-8-203863 (1996-08-01), None
patent: B2-2552152 (1996-08-01), None
patent: B2-2589209 (1996-12-01), None
patent: B2-2602808 (1997-01-01), None
patent: B2-2635607 (1997-04-01), None
patent: B2-2647884 (1997-05-01), None
patent: A-9-162168 (1997-06-01), None
patent: B2-2667552 (1997-06-01), None
patent: B2-2671312 (1997-07-01), None
patent: A-9-260663 (1997-10-01), None
patent: A-9-283535 (1997-10-01), None
patent: A-9-307101 (1997-11-01), None
patent: A-9-330928 (1997-12-01), None
patent: A-9-331063 (1997-12-01), None
patent: B2-2794565 (1998-06-01), None
patent: A-10-229119 (1998-08-01), None
patent: A-11-97523 (1999-04-01), None
patent: A-11-102961 (1999-04-01), None
U.S. patent application Ser. No. 09/630,786, Ishikawa, filed Aug. 2, 2000.
U.S. patent application Ser. No. 09/790,888, Soga et al., filed Feb. 23, 2001.
S. J. Fonash, “Damage Effects in Dry Etching”, Solid State Technology, Apr. 1985, pp. 201-205.
Aoki Takaaki
Arakawa Takafumi
Kuroyanagi Akira
Suzuki Mikimasa
Tsuzuki Yukio
Denso Corporation
Dolan Jennifer M
Jr. Carl Whitehead
Posz & Bethards, PLC
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