Semiconductor device and method for making the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C257SE29131, C257SE29257, C257S330000

Reexamination Certificate

active

07910440

ABSTRACT:
A semiconductor device includes: a first trench that is formed in a semiconductor substrate; a gate oxide film that is formed on a surface of the first trench; and a trench gate electrode that is formed so as to bury the first trench via the gate oxide film. The semiconductor device also includes: a second trench that is formed in the semiconductor substrate with a width wider than the width of the first trench; and a terminal-embedded insulation layer that is formed so as to bury the second trench. The semiconductor device further includes: a third trench that is formed in the semiconductor substrate with a width wider than the width of the second trench; and a trench contact electrode that is formed so as to bury the third trench.

REFERENCES:
patent: 6621107 (2003-09-01), Blanchard et al.
patent: 6750511 (2004-06-01), Kawano et al.
patent: 6818947 (2004-11-01), Grebs et al.
patent: 6919249 (2005-07-01), Kawano et al.
patent: 2004/0171271 (2004-09-01), Heo et al.
patent: 2003-92405 (2003-03-01), None

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