Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-04-12
2011-04-12
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S589000, C257S332000, C257S330000, C257SE29262, C257SE21410
Reexamination Certificate
active
07923333
ABSTRACT:
A method for fabricating a semiconductor device includes forming a trench in a substrate, forming a gate electrode buried over the trench to form a buried gate pattern, etching portions of the substrate on both sides of the buried gate pattern to a certain depth, performing an ion implantation process on the substrate to form source/drain junctions, and forming metal patterns over the source/drain junctions.
REFERENCES:
patent: 5736435 (1998-04-01), Venkatesan et al.
patent: 7633109 (2009-12-01), Lee et al.
patent: 2006/0022264 (2006-02-01), Mathew et al.
patent: 2006/0134858 (2006-06-01), Yamazaki
Hynix / Semiconductor Inc.
IP & T Group LLP
Karimy Mohammad T
Smith Bradley K
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