Semiconductor device and method for fabricating the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S217000, C438S238000, C438S239000, C438S240000, C438S241000, C438S253000, C438S256000, C257SE21011

Reexamination Certificate

active

07491606

ABSTRACT:
A method for fabricating a three dimensional type capacitor is provided. The method includes forming a first insulation layer including first contact layers over a substrate, forming a second insulation layer over the first insulation layer, forming second contact layers by using a material having an etch selectivity different from the first contact layers such that the second contact layers are connected with the first contact layers within the second insulation layer, forming an etch stop layer over the second insulation layer and the second contact layers, forming a third insulation layer over the etch stop layer, etching the third insulation layer and the etch stop layer to form first contact holes exposing the second contact layers, etching the exposed second contact layers to form second contact holes exposing the first contact holes, and forming bottom electrodes over the inner surface of the second contact holes.

REFERENCES:
patent: 6365453 (2002-04-01), Deboer et al.
patent: 2004/0266100 (2004-12-01), Cho et al.
patent: 2003-0091450 (2003-12-01), None

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