Semiconductor device and method for fabricating the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S785000

Reexamination Certificate

active

06849505

ABSTRACT:
Disclosed is a semiconductor device having a double dielectric layer, wherein the double dielectric layer comprises a first dielectric layer having aluminum and a second dielectric layer, of which a dielectric constant is higher than that of the first dielectric layer, stacked on the first dielectric layer. Also disclosed are methods for fabricating the semiconductor device.

REFERENCES:
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patent: 6168991 (2001-01-01), Choi et al.
patent: 6177284 (2001-01-01), Horii et al.
patent: 6207489 (2001-03-01), Nam et al.
patent: 6309927 (2001-10-01), Au et al.
patent: 6534395 (2003-03-01), Werkhoven et al.
patent: 20010015456 (2001-08-01), Bui
patent: 20010044187 (2001-11-01), Joo et al.
patent: 20030071304 (2003-04-01), Ogle et al.
patent: 2001-036045 (2001-02-01), None
patent: 2001-057414 (2001-02-01), None
patent: 2001210734 (2001-08-01), None
patent: 2000-0027836 (2000-05-01), None
patent: 2000-0041370 (2000-07-01), None
patent: 2001066386 (2001-07-01), None
patent: 2001-0063468 (2001-07-01), None
Wolf et al., “Silicon Processing for the VLSI Era vol. 1: Process Technology”, pp. 516-521, 532-533, 1986, Lattice Press.*
Notice of Preliminary Rejection from the Korean Intellectual Property Office, dated May 26, 2003, 2 pages, with English translation (1 page).
English abstract for KR 2000-0027836, 2 pages.
English abstract for KR 2001-0063468, 2 pages.
English abstract for KR 2000-0041370, 2 pages.
U.S. patent application Publication No. 2001/0013629 A1, published Aug. 16, 2001.

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