Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2005-05-25
2010-11-09
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C257S903000, C257SE21661, C257SE27098, C365S063000
Reexamination Certificate
active
07830703
ABSTRACT:
A semiconductor device having SRAM cell units each comprising a pair of a first driving transistor and a second driving transistor, a pair of a first load transistor and a second load transistor, and a pair of a first access transistor and a second access transistor, wherein each of the transistors comprises a semiconductor layer projecting upward from a substrate plane, a gate electrode extending on opposite sides of the semiconductor layer so as to stride over a top of the semiconductor layer, a gate insulating film interposed between the gate electrode and the semiconductor layer, and a pair of source/drain areas formed in the semiconductor layer; and the first and second driving transistors each have a channel width larger than that of at least either each of the load transistors or each of the access transistors.
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Koh Risho
Nomura Masahiro
Takeda Koichi
Takeuchi Kiyoshi
Tanaka Katsuhiko
NEC Corporation
Nguyen Dang T
Sofocleous Alexander
Sughrue & Mion, PLLC
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