4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Non-single crystal, or recrystallized, semiconductor...
  6. Non-single crystal, or recrystallized, material with...

Hiroyuki Ohta

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Analog quantity display method, analog quantity measuring...

Geometrical instruments – Distance measuring – Opposed contacts
Reexamination Certificate

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Apparatus for manufacturing a semiconductor device having conduc

Coating apparatus – Gas or vapor deposition
Patent

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Apparatus for measuring a mechanical quantity

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

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Apparatus for measuring a mechanical quantity

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

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Apparatus for measuring a mechanical quantity

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-211852

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