Semiconductor device and a method of manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S585000, C438S592000

Reexamination Certificate

active

07105394

ABSTRACT:
A method of manufacturing a semiconductor device having an n-type FET and p-type FET, each formed over a semiconductor substrate, calls for (a) forming, over the n-type FET and p-type FET, a first insulating film, for generating a tensile stress in the channel formation region of the n-type FET, to cover gate electrodes of the FETs, while covering, with an insulating film, a semiconductor region between the gate electrode of the p-type FET and an element isolation region of the semiconductor substrate; (b) selectively removing the first insulating film from the upper surface of the p-type FET by etching; (c) forming, over the n-type and p-type FETs, a second insulating film, for generating a compressive stress in the channel formation region of the p-type FET, to cover gate electrodes of the FETs; and (d) selectively removing the second insulating film from the upper surface of the n-type FET.

REFERENCES:
patent: 5464783 (1995-11-01), Kim et al.
patent: 5677249 (1997-10-01), Fukui et al.
patent: 6057241 (2000-05-01), Matsuda et al.
patent: 6559012 (2003-05-01), Shukuri et al.
patent: 6646313 (2003-11-01), Shukuri et al.
patent: 6661096 (2003-12-01), Takayama et al.
patent: 6727187 (2004-04-01), Takeshima et al.
patent: 6808951 (2004-10-01), Ikeda et al.
patent: 6809399 (2004-10-01), Ikeda et al.
patent: 2002/0081794 (2002-06-01), Ito
patent: 2003/0139025 (2003-07-01), Lee et al.
patent: 2004/0090838 (2004-05-01), Kuroda et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and a method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and a method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and a method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3588127

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.