Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Die bond
Reexamination Certificate
2011-01-11
2011-01-11
Le, Dung A. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Die bond
C257S782000, C257S781000, C257S780000, C257SE21514
Reexamination Certificate
active
07868467
ABSTRACT:
A semiconductor device includes a first substrate, a plurality of cell transistors and a second substrate. The first substrate has a first surface and a second surface opposite to the first surface. The plurality of cell transistors is formed extending on the first surface of the first substrate in a direction. The second substrate has an upper surface making contact with the second surface of the first substrate. Further, the upper surface of the second substrate has a bent structure to apply tensile stresses to the first substrate in the extending direction of the plurality of cell transistors. Thus, tensile stresses may be applied to the first substrate to improve the mobility of carriers in a channel region of the cell transistors.
REFERENCES:
patent: 5461774 (1995-10-01), Holmes et al.
patent: 5801084 (1998-09-01), Beasom et al.
patent: 6308938 (2001-10-01), Futakuchi
patent: 2006/0141742 (2006-06-01), Fournel et al.
patent: 2007/0257336 (2007-11-01), Matsumoto
patent: 11-102985 (1999-04-01), None
patent: 1999-0030681 (1999-07-01), None
United States Patent No. 6,308,938 corresponding to Foreign Document No. JP 11-102985.
Kang Hee-Soo
Lee Choong-ho
Park Kyu-Charn
F. Chau & Associates LLC
Le Dung A.
Samsung Electronics Co,. Ltd.
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