Semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

Other Related Categories

C438S273000, C438S589000, C257S330000, C257SE21419

Type

Reexamination Certificate

Status

active

Patent number

07470589

Description

ABSTRACT:
A trench-structure semiconductor device is highly reliable and has an increased resistance to hydrofluoric acid cleaning or other cleaning of an insulation film between a gate electrode, which is embedded in a trench, and source electrode. In a trench-structure semiconductor device, a silicon nitride film is over the gate electrode and embedded up to a point close to the open edge on the inside of trench. A source electrode is formed in contact with the surface of the silicon nitride film and the surface of the source region.

REFERENCES:
patent: 5148257 (1992-09-01), Kishi
patent: 6319784 (2001-11-01), Yu et al.
patent: 6861701 (2005-03-01), Williams et al.
patent: 6884684 (2005-04-01), Huang et al.
patent: 2002/0130359 (2002-09-01), Okumura et al.
patent: 2002/0137306 (2002-09-01), Chen
patent: 2003/0080378 (2003-05-01), Zundel et al.
patent: 2002-280553 (2002-09-01), None

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