Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-17
2005-05-17
Wilson, Allan R. (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S257000, C257S263000, C257S264000, C257S265000, C257S266000, C257S076000, C257S077000, C257S135000, C257S136000, C257S134000, C257S256000, C257S394000, C257S342000
Reexamination Certificate
active
06894346
ABSTRACT:
A structure is provided that ensures a low on-resistance and a better blocking effect. In a lateral type SIT (Static Induction Transistor) in which a first region is used as a p+gate and a gate electrode is formed on the bottom of the first region, the structure is built such that the p+gate and an n+source are contiguous. An insulating film is formed on the surface of an n−channel, and an auxiliary gate electrode is formed on the insulating film. In addition, the auxiliary gate electrode and the source electrode are shorted.
REFERENCES:
patent: 5079607 (1992-01-01), Sakurai
patent: 6281521 (2001-08-01), Singh
S. Harada et al., “Back-Gate 4H-SiC JFET Fabricated on N-Type Substrate”, The Japan Society of Applied Physics, The 61stAutumn Meeting, 2000. (No month cited).
Onose Hidekatsu
Watanabe Atsuo
Hitachi , Ltd.
Hogan & Hartson LLP
Nguyen Joseph
Wilson Allan R.
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