Semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S410000

Reexamination Certificate

active

06875662

ABSTRACT:
The invention offers a highly reliable semiconductor device with high yields. The semiconductor device includes a silicon substrate, a gate insulating film formed on one main plane of a silicon substrate and mainly including zirconium oxide of hafnium oxide, and a gate electrode film formed in contact with the gate insulating film. The gate insulating film contains an additional element for stabilizing the amorphous state.

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N. Bernstein, et al., Physical Review B, “Amorphous-crystal Interface in silicon: A tight-binding simulation”, Aug. 15, 1998-II, vol. 58, pp 4579-4581.

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