4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Gating
  6. Utilizing three or more electrode solid-state device

Jan Lehmann

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Semiconductor component for controlling power semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor component for direct gate control and...

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Utilizing three or more electrode solid-state device
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2686787

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