Semiconductor chip having TSV (through silicon via) and...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With electrical contact in hole in semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S686000, C257S774000, C257S777000, C257SE23010, C257SE23023

Reexamination Certificate

active

07838967

ABSTRACT:
A semiconductor chip having through silicon vias (TSV) and a stacked assembly including the chip are revealed. The chip has a plurality of first and second bonding pads disposed on two opposing surfaces of a semiconductor substrate respectively. Through hole vertically penetrate through the semiconductor substrate and the first and second bonding pads. By forming first extruded ring, the first bonding pad has a first contact surface located between the first extruded ring and the through hole. By forming second extruded ring, the second bonding pad has a second contact surface located outside and adjacent to the second extruded rings to encircle the second extruded ring. The second extruded ring has a proper dimension to fit in the first extruded ring. Accordingly, a plurality of semiconductor chip can be stacked each other with accurate alignment without shifting to effectively reduce the stacked assembly height, moreover, chip stacking processes are accomplished by vertically stacking a plurality of chips first then filling conductive material into the through holes without electrical short between the adjacent bonding pads due to overflow of conductive material to meet the fine-pitch requirements of TSV. The process flow for the stacked assembly is simplified with higher production yields.

REFERENCES:
patent: 5408123 (1995-04-01), Murai
patent: 6566232 (2003-05-01), Hara et al.
patent: 6577013 (2003-06-01), Glenn et al.
patent: 6848177 (2005-02-01), Swan et al.
patent: 6908785 (2005-06-01), Kim
patent: 7091592 (2006-08-01), Chen et al.
patent: 2003/0151144 (2003-08-01), Muta et al.
patent: 2008/0032448 (2008-02-01), Simon et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor chip having TSV (through silicon via) and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor chip having TSV (through silicon via) and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor chip having TSV (through silicon via) and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4252238

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.