Semiconductor channel on insulator structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S270000, C438S272000, C438S589000

Reexamination Certificate

active

07138316

ABSTRACT:
A method including forming a via dielectric layer on a semiconductor device substrate; forming a trench dielectric layer on the via dielectric layer; forming a trench through the trench dielectric layer to expose the via dielectric layer; forming a via in the via dielectric layer through the trench to expose the substrate; and forming a semiconductor material in the via and in the trench. An apparatus including a device substrate; a dielectric layer formed on a surface of the device substrate; and a device base formed on the dielectric layer including a crystalline structure derived from the device substrate.

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patent: 5646058 (1997-07-01), Taur et al.
patent: 6004837 (1999-12-01), Gambino
patent: 6271104 (2001-08-01), Razeghi et al.
patent: 6391721 (2002-05-01), Nakagawa
patent: 6495385 (2002-12-01), Xie
patent: 19928564 (1999-06-01), None
patent: 02087632 (1990-03-01), None
patent: WO 0079602 (2000-12-01), None

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