Semiconductor capacitor structure and method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE27089

Reexamination Certificate

active

07544985

ABSTRACT:
In one embodiment, a semiconductor device comprises a base and a tapered wall formed on the base. The wall has a midline and also has an inner sidewall and an outer sidewall. The inner sidewall and the outer sidewall are substantially symmetrical with each other in relation to the midline. Thus, the reliability of the semiconductor capacitor structure can be improved and the throughput can be increased. Also, further scaling down of semiconductor devices can be facilitated with the principles of the present invention.

REFERENCES:
patent: 4715930 (1987-12-01), Diem
patent: 5393688 (1995-02-01), Motonami et al.
patent: 5843822 (1998-12-01), Hsia et al.
patent: 5861331 (1999-01-01), Chien
patent: 5903024 (1999-05-01), Hsu
patent: 6387752 (2002-05-01), Sakao
patent: 6459112 (2002-10-01), Tsuboi et al.
patent: 6544345 (2003-04-01), Mayer et al.
patent: 6548853 (2003-04-01), Hwang et al.
patent: 2003/0017677 (2003-01-01), Yu et al.
patent: 2003/0122174 (2003-07-01), Fukuzumi
patent: 1278658 (2001-01-01), None
patent: 10-289981 (1998-10-01), None
patent: 1996-0043175 (1996-12-01), None
patent: 1998-031090 (1998-07-01), None
patent: 1999-075646 (1999-10-01), None
patent: 2001-65795 (2001-11-01), None
patent: 2002-0091642 (2002-12-01), None
patent: 2003-0002849 (2003-01-01), None
English language Abstract from Korean Patent Publication No. 1996-0043175.
English language Abstract from Korean Patent Publication No. 1998-031090.
English language Abstract from Korean Patent Publication No. 1999-075646.
English language Abstract from Korean Patent Publication No. 2001-65795.
English language Abstract from Korean Patent Publication No. 2002-0091642.
English language Abstract from Korean Patent Publication No. 2003-0002849.
English language Abstract from Japanese Patent Publication No. 10-289981.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor capacitor structure and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor capacitor structure and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor capacitor structure and method for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4139750

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.