Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-10-06
2008-08-05
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
07409618
ABSTRACT:
A system and method for testing a device with multiple interfaces by generating a predetermined data pattern within the device, transmitting the pattern to a test analyzer, generating a second predetermined data pattern within the test analyzer, and simultaneously transmitting the second test pattern to the device where the second test pattern is verified. The first and second test patterns may be the same or different, depending on the application. Further, the transmit and receive paths may be tested separately and independently in addition to simultaneously.
REFERENCES:
patent: 5663967 (1997-09-01), Lindberg et al.
patent: 6961317 (2005-11-01), Abramovitch et al.
patent: 6993696 (2006-01-01), Tanizaki et al.
patent: 7127648 (2006-10-01), Jiang et al.
Gauvin Coralyn
Romero Gabriel
Chung Phung M
Krajec Patent Offices, LLC
LSI Corporation
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