Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-07-29
2008-07-29
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S726000
Reexamination Certificate
active
07406641
ABSTRACT:
To facilitate testing, some integrated circuits include built-in test circuits, called test-access ports (TAPs). The present inventor recognized that TAPs are sometimes used with automatic testers that have limitations, such as insufficient memory capacity, that make it difficult or costly to test some integrated circuits, such as microprocessors. Accordingly, this disclosure teaches, among other things, inputting test signals to a TAP of an integrated circuit using a first device, such as an automatic tester, and outputting state data related to the input test signals from the TAP using a second device.
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Chung Phung M
Intel Corporation
Schwegman Lundberg & Woessner, P.A.
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