Selecting between tap/scan with instructions and lock out...

Details Selecting between tap/scan with instructions and lock out... Selecting between tap/scan with instructions and lock out...

2007-04-03

2009-06-09

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S726000

Reexamination Certificate

active

07546503

ABSTRACT:
A process of selecting alternative test circuitry within an integrated circuit enables a test access port. Scan test instruction data is loaded into an instruction register of a test access port TAP, the instruction data including information for selecting the alternative test circuitry. An Update-IR instruction update operation is performed at the end of the loading to output scan test control signals from the instruction register. A lockout signal is changed to an active state to disable the test access port and enable scan test circuits.

REFERENCES:
patent: 5606566 (1997-02-01), Whetsel
patent: 6311302 (2001-10-01), Cassetti et al.
patent: 6587981 (2003-07-01), Muradali et al.
patent: 6658614 (2003-12-01), Nagoya

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