Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2006-10-03
2006-10-03
Lee, Eddie C. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S767000, C257S768000, C257S779000, C257S620000, C257S621000, C257S730000, C257S786000
Reexamination Certificate
active
07115997
ABSTRACT:
An integrated circuit (IC) chip, semiconductor wafer with IC chips in a number of die locations and a method of making the IC chips on the wafer. The IC chips have plated chip interconnect pads. Each plated pad includes a noble metal plated layer electroplated to a platable metal layer. The platable metal layer may be copper and the noble metal plated layer may be of gold, platinum, palladium, rhodium, ruthenium, osmium, iridium or indium.
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IBM Technical Disclosure Bulletin, vol. 23, No. 8 Jan. 1981, “Kerf testing Of Embedded Structure Technologies” by C. J. Kugler, Jr. and G. E. Rudgers pp. 3716-3719.
Narayan Chandrasekhar
Petrarca Kevin Shawn
Blecker, Esq. Ira D.
Im Junghwa
International Business Machines - Corporation
Law Office of Charles W. Peterson, Jr.
Lee Eddie C.
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