Seedless wirebond pad plating

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C257S767000, C257S768000, C257S779000, C257S620000, C257S621000, C257S730000, C257S786000

Reexamination Certificate

active

07115997

ABSTRACT:
An integrated circuit (IC) chip, semiconductor wafer with IC chips in a number of die locations and a method of making the IC chips on the wafer. The IC chips have plated chip interconnect pads. Each plated pad includes a noble metal plated layer electroplated to a platable metal layer. The platable metal layer may be copper and the noble metal plated layer may be of gold, platinum, palladium, rhodium, ruthenium, osmium, iridium or indium.

REFERENCES:
patent: 4956602 (1990-09-01), Parrish
patent: 5313158 (1994-05-01), Joosten et al.
patent: 5670428 (1997-09-01), Beilstein, Jr. et al.
patent: 5804464 (1998-09-01), Beilstein, Jr. et al.
patent: 6368484 (2002-04-01), Valant et al.
patent: 6448171 (2002-09-01), Wang et al.
patent: 6534863 (2003-03-01), Walker et al.
patent: 6566736 (2003-05-01), Ogawa et al.
patent: 6960828 (2005-11-01), Nair et al.
patent: 2004/0099877 (2004-05-01), Towle et al.
IBM Technical Disclosure Bulletin, vol. 23, No. 8 Jan. 1981, “Kerf testing Of Embedded Structure Technologies” by C. J. Kugler, Jr. and G. E. Rudgers pp. 3716-3719.

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