Scanning ion probe systems and methods of use thereof

Details Scanning ion probe systems and methods of use thereof Scanning ion probe systems and methods of use thereof

2006-01-19

2008-10-28

Vanore, David A. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Positive ion probe or microscope type

C250S251000, C250S288000, C435S006120

Reexamination Certificate

active

07442927

ABSTRACT:
Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.

REFERENCES:
patent: 2003/0129737 (2003-07-01), van der Weide

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