Scan controller and integrated circuit including such a...

Details Scan controller and integrated circuit including such a... Scan controller and integrated circuit including such a...

2006-09-19

2006-09-19

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07111216

ABSTRACT:
An integrated circuit is provided in which a scan controller for controlling a scan test is integrated within the integrated circuit and shares the same input pins as a serial programmable interface of the integrated circuit.

REFERENCES:
patent: 6378093 (2002-04-01), Whetsel
patent: 6766487 (2004-07-01), Saxena et al.
patent: 2003/0149924 (2003-08-01), Bedal et al.
patent: 2004/0177300 (2004-09-01), Biewenga et al.

Affiliated with

Also associated with

Rating

Scan controller and integrated circuit including such a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scan controller and integrated circuit including such a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scan controller and integrated circuit including such a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3550528