Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate
2007-05-08
2007-05-08
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
C250S305000, C250S306000, C250S307000, C250S310000
Reexamination Certificate
active
11228400
ABSTRACT:
Preparations are made for the transmission image of an object tilted as a reference image and the image obtained by polar coordinate conversion of this transmission image, and correlation is established with the image obtained by polar coordinate conversion of the transmission image of the object in a sample.
REFERENCES:
patent: 4618766 (1986-10-01), van der Mast et al.
patent: 5706416 (1998-01-01), Mann et al.
patent: 5983251 (1999-11-01), Martens et al.
patent: 6476388 (2002-11-01), Nakagaki et al.
patent: 6552340 (2003-04-01), Krivanek et al.
patent: 6570156 (2003-05-01), Tsuneta et al.
patent: 6756589 (2004-06-01), Obara et al.
patent: 2002/0028399 (2002-03-01), Nakasuji et al.
patent: 2003/0039386 (2003-02-01), Ishitani et al.
patent: 62-078684 (1987-04-01), None
patent: 64-023379 (1989-01-01), None
patent: 9-245709 (1997-09-01), None
patent: 2001-006588 (2001-01-01), None
patent: 2001-068050 (2001-03-01), None
patent: 2001-118535 (2001-04-01), None
patent: 2002-25491 (2002-01-01), None
Nagaoki Isao
Nakazawa Eiko
Dickstein & Shapiro LLP
Hitachi High-Technologies Corp.
Hitachi Science Systems Ltd.
Wells Nikita
LandOfFree
Sample observation method and transmission electron microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sample observation method and transmission electron microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample observation method and transmission electron microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3804688