Sample observation method and transmission electron microscope

Details Sample observation method and transmission electron microscope Sample observation method and transmission electron microscope

2006-01-03

2006-01-03

Lee, John R. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

C250S305000, C250S306000

Reexamination Certificate

active

06982420

ABSTRACT:
Preparations are made for the transmission image of an object tilted as a reference image and the image obtained by polar coordinate conversion of this transmission image, and correlation is established with the image obtained by polar coordinate conversion of the transmission image of the object in a sample.

REFERENCES:
patent: 4618766 (1986-10-01), van der Mast et al.
patent: 5706416 (1998-01-01), Mann et al.
patent: 5983251 (1999-11-01), Martens et al.
patent: 6570156 (2003-05-01), Tsuneta et al.
patent: 2003/0039386 (2003-02-01), Ishitani etal.
patent: 9-245709 (1997-09-01), None
patent: 2002-25491 (2002-01-01), None

Affiliated with

Also associated with

Rating

Sample observation method and transmission electron microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sample observation method and transmission electron microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample observation method and transmission electron microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3557279