Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-12-04
2007-12-04
Nguyen, Tu T. (Department: 2886)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
11497920
ABSTRACT:
Spectroscopic ellipsometer systems which include polarizer and analyzer elements which remain fixed in position during data acquisition while at least one continuously rotating or step-wise rotatable compensator imposes a continuously variable or plurality of sequentially discrete polarization states on a beam of electromagnetic radiation, including a system of mirrors and refractive elements for correcting aberation while directing a beam of electromagnetic radiation to a spot on a sample at a multiple different angles-of-incidence.
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J.A. Woollam Co. Flyer on VUV-Vase.
Green Steven E.
Hale Jeffrey S.
He Ping
Herzinger Craig M.
Johs Blaine D.
J.A. Woollam Co., Inc
Nguyen Tu T.
Welch James D.
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