Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Finishing or perfecting composition or product
Reexamination Certificate
2005-04-20
2010-10-12
Kelly, Cynthia H (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Finishing or perfecting composition or product
C430S311000
Reexamination Certificate
active
07811748
ABSTRACT:
A method of producing a high-quality product without damaging the physical properties of a pattern to be formed by a rinsing process based on a principle totally different from that for a conventional pattern collapse preventing method. A method for forming a resist pattern by subjecting a photo-resist layer provided on a substrate to image-forming exposure and then developing the resultant layer, wherein the resist pattern is formed, after the developing process, by the process of reducing a contact angle with respect to a contact liquid on the surface of the resist pattern to up to 40 degrees, then by the process of increasing it to at least 70 degrees, and further by drying it.
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Toshihiko Tanaka et al., “Mechanism of Resist Pattern Collapse During Development Process”, Japan Appl. Phys., vol. 32 (1993), pp. 6059-6064.
Kaneko Fumitake
Koshiyama Jun
Miyamoto Atsushi
Sawada Yoshihiro
Tajima Hidekazu
Eoff Anca
Kelly Cynthia H
Tokyo Ohka Kogyo Co. Ltd.
Wenderoth , Lind & Ponack, L.L.P.
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