Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Reexamination Certificate
2011-07-12
2011-07-12
Duda, Kathleen (Department: 1722)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
Reexamination Certificate
active
07977036
ABSTRACT:
A fine and high-accuracy resist pattern, which is excellent in etching resistance, can be formed. Disclosed is a resist pattern forming method, which includes the steps of developing a resist composition having photosensitivity to a predetermined light source through a lithography technique to form a resist pattern2on a substrate1, and bringing the resist pattern2into contact with a supercritical processing solution5′including a supercritical fluid3′which contains a crosslinking agent4.
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Namatsu Hideo
Sato Mitsuru
Duda Kathleen
Harness & Dickey & Pierce P.L.C.
Nippon Telegraph and Telephone Corporation
Tokyo Ohka Kogyo Co. Ltd.
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