Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1978-07-19
1981-06-16
Kimlin, Edward C.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430281, 430287, 430313, 430323, 430325, 430942, 430967, 20415915, 20415919, G03C 500
Patent
active
042738580
ABSTRACT:
A resist material for micro-fabrication comprising a polymer in which the polymer backbone has thereon a moiety of the formula (I) ##STR1## wherein R represents a hydrogen atom, an alkyl group, an alkenyl group or an aryl group or an aralkyl group, the resist material being curable by electromagnetic radiation such as electron beams, X-rays or deep ultraviolet light with a wave length of less than about 3000A and being particularly suitable as a micro-fabrication resist material.
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Nagasawa Kohtaro
Ochi Hideo
Shibata Yumi
Tanaka Fujio
Kimlin Edward C.
Somar Manufacturing Co. Ltd.
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