Resist composition and method for forming a pattern using...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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Details

C430S281100, C430S286100, C430S311000, C430S317000, C430S318000, C430S330000, C430S331000, C430S913000, C430S927000

Reexamination Certificate

active

08053164

ABSTRACT:
The present invention relates to a resist composition with a hardener and a solvent, and a method for forming a pattern using the resist composition. The hardener has a thermal-decomposable core part, and a first photosensitive bond art. The solvent has a low-molecular resin, and a second photosensitive bond part.

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English language machine translation pf JP 2003-221420 (no date).
Machine translation of JP 2003-221420 (no date).

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