Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-11-28
2009-02-03
Lam, David (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700, C365S230080, C365S189050
Reexamination Certificate
active
07486577
ABSTRACT:
A repair circuit and related method of repair are disclosed. In the repair circuit, row repair or column repair control units are selectively actuated to perform respective repair functions within a semiconductor memory device in relation to a commonly provided defective address. Both post-package defects and/or before package defects may be repaired in response to the defective address.
REFERENCES:
patent: 6809972 (2004-10-01), Lehmann et al.
patent: 7286419 (2007-10-01), Doi
patent: 1999-006005 (1999-01-01), None
patent: 1020030057299 (2003-07-01), None
Jeong Byung-Hoon
Kim Hyung-Jik
Lam David
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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