Redundancy circuit in semiconductor memory device having a...

Static information storage and retrieval – Read/write circuit – Having fuse element

Reexamination Certificate

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C365S203000, C365S200000, C365S230060, C365S230030

Reexamination Certificate

active

07075848

ABSTRACT:
A redundancy circuit in a semiconductor memory device having a multiblock structure in which a memory cell array is classified into a plurality of memory cell blocks, an integrated redundancy circuit having a plurality of fuse boxes for storing, per block, addresses of defective memory cells provided in the plurality of memory cell blocks, the plurality of fuse boxes being connected to the common precharge unit and being selectively activated in response to a block distinction selection signal.

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