Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2006-07-11
2006-07-11
Nguyen, Viet Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S203000, C365S200000, C365S230060, C365S230030
Reexamination Certificate
active
07075848
ABSTRACT:
A redundancy circuit in a semiconductor memory device having a multiblock structure in which a memory cell array is classified into a plurality of memory cell blocks, an integrated redundancy circuit having a plurality of fuse boxes for storing, per block, addresses of defective memory cells provided in the plurality of memory cell blocks, the plurality of fuse boxes being connected to the common precharge unit and being selectively activated in response to a block distinction selection signal.
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Choi Byung-Gil
Kim Du-Eung
Kwak Choong-Keun
F. Chau & Associates LLC
Nguyen Viet Q.
Samsung Electronics Co,. Ltd.
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