Reducing memory failures in integrated circuits

Details Reducing memory failures in integrated circuits Reducing memory failures in integrated circuits

2007-03-06

2007-03-06

Hur, J. H. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S201000, C365S225700, C365S145000, C714S710000, C714S764000, C714S006130, C714S006130, C714S006130

Reexamination Certificate

active

10250211

ABSTRACT:
Memory reliability is improved by using redundancy to repair errors detected by ECC. In one embodiment, redundancy repairs errors which cannot be corrected by ECC. The redundancy can employ the use of electronic fuses, enabling repairs after an IC containing the memory is packaged. Redundancy can also be performed prior to packaging of the IC.

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