Read operation for semiconductor memory devices

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition

Reexamination Certificate

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C365S185210, C365S185080

Reexamination Certificate

active

07571276

ABSTRACT:
Disclosed is a method of performing a read operation in a NAND/RAM semiconductor memory device. The semiconductor memory device comprises a NAND flash memory device having a memory cell array and a page buffer, and a data RAM outputting data in response to a clock signal received from a host. The method comprising; sensing data stored in one page of the memory cell array in the page buffer, transferring the sensed data from the page buffer to the data RAM in multiple blocks via a corresponding number of transfer operations, and reading the transferred data from the data RAM in response to the host clock signal, wherein a read-out operation for the transferred data commences during any one of the plurality of transfer time periods.

REFERENCES:
patent: 5754469 (1998-05-01), Hung et al.
patent: 6744692 (2004-06-01), Shiota et al.
patent: 6775185 (2004-08-01), Fujisawa et al.
patent: 6791877 (2004-09-01), Miura et al.
patent: 7136978 (2006-11-01), Miura et al.
patent: 7411859 (2008-08-01), Sohn et al.
patent: 2002/0083262 (2002-06-01), Fukuzumi
patent: 2005/0146939 (2005-07-01), Conley et al.
patent: 08249894 (1996-09-01), None
patent: 2002366429 (2002-12-01), None
patent: 2003-233529 (2003-08-01), None
patent: 2003-317487 (2003-11-01), None
patent: 2004013337 (2004-01-01), None
patent: 2004102781 (2004-04-01), None
patent: 1020030067494 (2003-08-01), None
patent: 1020030082917 (2003-10-01), None
patent: 10-2004-0097272 (2004-11-01), None
patent: WO-03/085676 (2003-10-01), None

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