Reactor useful for chemical vapor deposition of titanium nitride

Coating apparatus – Gas or vapor deposition

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

118724, C23C 1600

Patent

active

061066257

ABSTRACT:
A plasma reaction chamber particularly configured for chemical vapor deposition of titanium nitride with a TDMAT precursor, the deposition including a plasma step. Gas is injected from a gas cavity in a showerhead electrode assembly through a large number of showerhead holes into the processing region over the wafer. The showerhead electrode is capable of being RF energized to create a plasma of a gas in the processing region. The showerhead electrode and other parts of the assembly are cooled by a cooling plate disposed above the gas cavity and connected to a rim of the showerhead electrode. A convolute water-cooling channel is formed in the cooling plate having a small cross section and numerous bends so as to create turbulent flow, thus aiding thermal transfer. The water cooling plate is connected to the showerhead electrode across a large horizontal interface, thus also aiding thermal flow. An edge ring assembly is positioned in a peripheral recess at the top of heater pedestal supporting the wafer next to the processing region. The showerhead is insulated from the chamber body by an isolator having a downwardly sloping lower surface facing the processing region. Thereby, the isolator by itself or in combination with a plasma confinement ring around the wafer confines the plasma to the process area and induces the exhaust to flow downwardly from the processing region. The assembly includes a Z-shaped heat shield disposed between the walls of the recess and of the pedestal side and other parts of the ring assembly with gaps between the various members, thereby promoting thermal isolation in the edge region as well as protecting the side of the pedestal.

REFERENCES:
patent: 4960488 (1990-10-01), Law et al.
patent: 5595606 (1997-01-01), Fujikawa et al.
patent: 5628829 (1997-05-01), Foster et al.
patent: 5665640 (1997-09-01), Foster et al.
patent: 5755886 (1998-05-01), Wang et al.
patent: 5846332 (1998-12-01), Zhao et al.
patent: 5882411 (1999-03-01), Zhao et al.
patent: 5906683 (1999-05-01), Chen et al.
Doppelt et al., Chemical Vapor Deposition of Copper for IC Metallization: Precursor Chemistry and Molecular Structure, MRS Bulletin, vol. 19, No. 8, Aug. 1994, pp. 41-48.
Gelatos et al., Chemical Vapor Deposition of Copper for Advanced On-Chip Interconnects, MRS Bulletin, vol. 19, No. 8, Aug. 1994, pp. 49-54

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Reactor useful for chemical vapor deposition of titanium nitride does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reactor useful for chemical vapor deposition of titanium nitride, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reactor useful for chemical vapor deposition of titanium nitride will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-576099

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.