Random access memory employing read before write for...

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch

Reexamination Certificate

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C365S189011, C365S163000

Reexamination Certificate

active

07729179

ABSTRACT:
An improved architecture and method for operating a PCRAM integrated circuit is disclosed which seeks to minimize degradation in the resistance of the phase change material in the cells. When an attempt is made during a write command to write a data state to a bit which already has that data state, such matching data states are identified and writing to those bits is precluded during the write command. In one embodiment, both the incoming data to be written to a bit and the data currently present at that bit address are latched. These latched data are then compared (e.g., with an XOR gate) to determine which bits have a matching data state. The results of this comparison are used as an enable signal to the write (column) driver in the PCRAM memory array, with the effect that only data bits having different data state are written, while data bits having a matching data state are not needlessly re-written. Because matching data states are ignored, reliability problems associated with such redundant writing are alleviated, and power is saved.

REFERENCES:
patent: 6111801 (2000-08-01), Brady
patent: 7126847 (2006-10-01), Ha et al.
patent: 7349245 (2008-03-01), Kim et al.
patent: 7359231 (2008-04-01), Venkataraman et al.
patent: 7362608 (2008-04-01), Schwerin et al.
patent: 7505330 (2009-03-01), Pawlowski et al.
patent: 2003/0198118 (2003-10-01), Lowery
patent: 2004/0225829 (2004-11-01), Akiyama et al.
patent: 2006/0034142 (2006-02-01), Ooishi et al.
S.H. Lee et al., “Full Integration and Cell Characteristics for 64Mb Nonvolatile PRAM,” 2004 Symp. On VLSI Technology Digest of Technical Papers, pp. 20-21 (2004).
S. Hudgens and B. Johnson, “Overview of Phase-Change Chalcogenide Nonvolatile Memory Technology,” MRS Bulletin, pp. 829-832 (Nov. 2004).
F. Yeung et al., “Ge2Sb2Te5 Confined Structures and Integration of 64 Mb Phase-Change Random Access Memory,” Japanese Journal of Applied Physics, vol. 44, No. 4B, pp. 2691-2695 (2005).
Y.N. Hwang et al., “Full Integration and Reliability Evaluation of Phase-change RAM Based on 0.24um-CMOS Technologies,” 2003 Symposium on VLSI Technology Digest of Technical Papers, pp. 173-147 (2003).
W.Y. Cho, et al., “A 0.18-um 3.0-V 64-Mb Nonvolatile Phase-Transition Random Access Memory (PRAM),” IEEE Journal of Solid-State Circuits, vol. 40, No. 1, pp. 293-300 (Jan. 2005).
F. Bedeschi, et al., “An 8Mb Demonstrator for High-Density 1.8V Phase-Change Memories,” 2004 Symposium on VLSI Circuits Digest of Technical Papers, pp. 442-445 (2004).

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