Projection lens for a microlithographic projection exposure...

Optical: systems and elements – Lens – With field curvature shaping

Reexamination Certificate

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C359S722000, C359S723000, C359S738000, C355S071000

Reexamination Certificate

active

07068436

ABSTRACT:
A projection lens (10) for a microlithographic projection exposure apparatus has a first optical element, for example a birefringent lens (L2), that has polarization dependent properties causing intensity fluctuations in an image plane of the projection lens. These fluctuation may be produced by a second optical element (24), for example a polarization selective beam splitting layer (28), that is arranged downstream of the first optical element. A gray filter (32; 132; 232) disposed in the beam path reduces the intensity fluctuations.

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patent: 6061188 (2000-05-01), Kamon
patent: 6245470 (2001-06-01), Kamon
patent: 6252712 (2001-06-01), Fürter et al.
patent: 6268903 (2001-07-01), Chiba et al.
patent: 2001/0010886 (2001-08-01), Kamon
patent: 2002/0085286 (2002-07-01), Drodofsky et al.
patent: 2003/0011896 (2003-01-01), Shiraishi
patent: 2003/0099034 (2003-05-01), Mann et al.
patent: 2003/0234981 (2003-12-01), Hoffman et al.
patent: 2004/0105170 (2004-06-01), Krahmer et al.
patent: 198 07 120 (1999-08-01), None
patent: WO 02/093209 (2002-11-01), None
patent: WO 02/099500 (2002-12-01), None

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