Programming and evaluating through PMOS injection

Static information storage and retrieval – Read/write circuit – Having fuse element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S189090

Reexamination Certificate

active

07324400

ABSTRACT:
A PMOS transistor includes a gate, drain, and source in a substrate and is isolated from adjacent transistors in the substrate by shallow trench isolation. The transistor is programmed by applying a gate voltage to the gate and generating a drain-to-source voltage across the transistor that is of sufficient magnitude such that electrons are injected into the shallow trench isolation. This degrades the transistor so that it cannot be turned off. In one embodiment, the magnitude of the source-to-drain voltage depends on the gate voltage.

REFERENCES:
patent: 4888735 (1989-12-01), Lee
patent: 4903091 (1990-02-01), Baba
patent: 4952788 (1990-08-01), Berger
patent: 5493235 (1996-02-01), Khayat
patent: 5545917 (1996-08-01), Peppiette
patent: 5594687 (1997-01-01), Lin
patent: 5646901 (1997-07-01), Sharpe-Geisler
patent: 5650747 (1997-07-01), Chen
patent: 5687118 (1997-11-01), Chang
patent: 5777495 (1998-07-01), Arques
patent: 5834813 (1998-11-01), Ma
patent: 5909392 (1999-06-01), Chang
patent: 6097635 (2000-08-01), Chang
patent: 6166954 (2000-12-01), Chern
patent: 6545504 (2003-04-01), Sun
patent: 6667902 (2003-12-01), Peng
patent: 6713839 (2004-03-01), Madurawe
patent: 6798693 (2004-09-01), Peng
patent: 2002/0114188 (2002-08-01), Lee
patent: 2003/0001666 (2003-01-01), Watanabe
patent: 2003/0043652 (2003-03-01), Yamauchi
patent: 2 442 815 (2002-10-01), None
Mar Hershenson, et al, “Optimal Design of a CMOS Op-Amp via Geometric Programming,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 20, No. 1, pp. 1-21, Jan. 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Programming and evaluating through PMOS injection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Programming and evaluating through PMOS injection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Programming and evaluating through PMOS injection will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2775962

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.