Programmable sub-surface aggregating metallization structure...

Static information storage and retrieval – Systems using particular element – Semiconductive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S182000

Reexamination Certificate

active

07142450

ABSTRACT:
A programmable sub-surface aggregating metallization structure (“PSAM”) includes an ion conductor such as a chalcogenide-glass which includes metal ions and at least two electrodes disposed at opposing surfaces of the ion conductor. Preferably, the ion conductor includes a chalcogenide material with Group IB or Group IIB metals. One of two electrodes is preferably configured as a cathode and the other as an anode. When a voltage is applied between the anode and cathode, a metal dendrite grows from the cathode through the ion conductor towards the anode. The growth rate of the dendrite may be stopped by removing the voltage or the dendrite may be retracted back towards the cathode by reversing the voltage polarity at the anode and cathode.

REFERENCES:
patent: 5138481 (1992-08-01), Demiryont
patent: 5315131 (1994-05-01), Kishimoto et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Programmable sub-surface aggregating metallization structure... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Programmable sub-surface aggregating metallization structure..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Programmable sub-surface aggregating metallization structure... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3683957

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.