Electronic digital logic circuitry – Reliability – Redundant
Reexamination Certificate
2005-11-15
2005-11-15
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Reliability
Redundant
C326S009000, C326S041000
Reexamination Certificate
active
06965249
ABSTRACT:
A programmable logic device and associated method is provided with repairable regions. In one aspect, general routing interconnect lines are segmented within repairable regions. In another aspect, IO bus lines and associated circuitry are provided that accommodate redundancy in a staggered segmented architecture. In another aspect, a dedicated routing architecture between particular logic regions accommodates shifting to define and utilize repairable regions. Principles of other aspects are illustrated and described in the context of several exemplary embodiments of aspects of the invention.
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Cashman David
Chan Michael
Jefferson David
Johnson Brian
Lane Christopher
Altera Corporation
Morrison & Foerster / LLP
Tran Anh Q.
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