Programmable impedance control circuit in semiconductor...

Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination

Reexamination Certificate

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Reexamination Certificate

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07362128

ABSTRACT:
A programmable impedance control circuit for use in a semiconductor device having an impedance range shifting function prevents or substantially reduces an impedance detection failure based on an environment change. An impedance detector includes a first array driver, a second array driver, and an impedance matching transistor array and a range shifting transistor array independently controlled by the first and second array drivers. A comparator each compares first and second output voltage levels of the impedance detector with an array reference voltage, and outputs an up/down signal as the comparison result. A counter performs an up/down counting in response to the up/down signal, and outputs control code data. A range shifting circuit monitors a counting output of the counter and so generates range shifting data. Whereby, even if there is an environment change on a manufacturing process, power source voltage or operating temperature, etc., an impedance matching and correction operation can be performed without a waste of impedance matching transistor array and control code.

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patent: 2002/0050838 (2002-05-01), Kim et al.
patent: 2004/0021481 (2004-02-01), Ohno
patent: 2006/0158216 (2006-07-01), Aoyama et al.

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