Programmable built in self test of memory

Details Programmable built in self test of memory Programmable built in self test of memory

2004-12-03

2008-01-29

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

07325178

ABSTRACT:
The pBIST solution to memory testing is a balanced hardware-software oriented solution. pBIST hardware provides access to all memories and other such logic (e.g. register files) in pipelined logic allowing back-to-back accesses. The approach then gives the user access to this logic through CPU-like logic in which the programmer can code any algorithm to target any memory testing technique required. Because hardware inside the chip is used at-speed, the full device speed capabilities are available. CPU-like hardware can be programmed and algorithms can be developed and executed after tape-out and while testing on devices in chip form is in process.

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