Programmable address space built-in self test (BIST) device...

Details Programmable address space built-in self test (BIST) device... Programmable address space built-in self test (BIST) device...

2011-05-17

2011-05-17

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S030000

Reexamination Certificate

active

07945823

ABSTRACT:
A built-in self-test (BIST) circuit for testing addressable locations can include a BIST generator (202) that can generate test addresses for testing each addressable location. Defective addresses can be stored in a fault address store (216). An address range selector circuit (230) can limit the range of addresses generated by an address generator (234). Once defective addresses for a first range have been detected, an address range selector circuit (230) can test another range. An entire address range can thus be tested regardless of the depth of a fault address store (216).

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