Production method for a semiconductor component

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S096000, C438S239000, C438S244000, C438S253000, C438S652000, C438S656000, C438S658000, C438S660000, C257S065000, C257S066000, C257S068000, C257S071000, C257S296000, C257S303000, C257S306000

Reexamination Certificate

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06919269

ABSTRACT:
A method for fabricating a semiconductor component includes: deposition of a polysilicon layer on a substrate, deposition of a precursor layer on the polysilicon layer, and deposition of a protective layer on the precursor layer. A crystalline transformation occurs in the precursor layer at a first temperature to form an electrode layer. The layers are patterned to form an electrode stack, and the polysilicon layer is oxidized at a second temperature such that no crystalline transformation occurs in the electrode layer.

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