Process variation tolerant circuit with voltage...

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates

Reexamination Certificate

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Details

C326S033000

Reexamination Certificate

active

07667497

ABSTRACT:
A circuit having dynamically controllable power. The circuit comprises a plurality of pipelined stages, each of the pipelined stages comprising two clocking domains, a plurality of switching circuits, each switching circuit being connected to one of the pipelined stages, first and second power sources connected to each of the plurality of pipelined stages through the switching circuits, the first power source supplying a first voltage and the second power source supplying a second voltage, wherein the first and second power sources each may be applied to a pipelined stage independently of other pipelined stages, first and second complementary clocks, and a plurality of latches connected to the first and second complementary clocks and to the plurality of pipelined stages for proving latch-based clocking to control the first and second clocking domains and to enable time-borrowing across the plurality of switching circuits. The first voltage differs from the second voltage and the plurality of pipelined stages interpolates between the first and second voltages to provide differing effective voltages between the first and second voltages.

REFERENCES:
patent: 6958627 (2005-10-01), Singh et al.
patent: 7511535 (2009-03-01), Chakraborty et al.
patent: 7587698 (2009-09-01), Rohe et al.
patent: 2005/0253462 (2005-11-01), Falkowski et al.
patent: 2006/0171477 (2006-08-01), Carballo et al.
patent: 2006/0172715 (2006-08-01), Carballo et al.
patent: 2007/0046323 (2007-03-01), Kuang et al.
patent: 2007/0047364 (2007-03-01), Chuang et al.
patent: 2007/0200593 (2007-08-01), Agarwal et al.
patent: 2007/0216457 (2007-09-01), Agarwal et al.
K. Bernstein, et al., “High-performance CMOS variability in the 65-nm regime and beyond,” IBM J. Res. & Dev. Vo. 50 No. 4/5 (Jul./Sep. 2006).
Borkar, S., “Tackling variability and reliability challenges,” IEEE Design & Test of Computers (2006).
Tran, C. Q., Kawaguchi, H. and Sakurai, T., “95% Leakage-Reduced FPGA using Zigzag Power-grating, Dual-VTH/VDD and Micro-VDD-Hopping,” IEEE (2005).
Agarwal, K. and Nowka, K., “Dynamic Power Management by Combination of Dual Static Supply Voltages,” Proceedings of the 8th Int'l Symposium on Quality Electronic Design (ISQED'07)(2007).
Borkar, S., “Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degredation,” IEEE 2005.

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