Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-10-05
2008-10-07
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S725000, C438S737000, C257SE21253, C257SE21257
Reexamination Certificate
active
07432210
ABSTRACT:
A method of opening a carbon-based hardmask layer composed of amorphous carbon containing preferably at least 60% carbon and between 10 and 40% hydrogen. The hardmask is opened by plasma etching using an etching gas composed of H2, N2, and CO. The etching is preferably performed in a plasma etch reactor having an HF biased pedestal electrode and a capacitively VHF biased showerhead.
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Ma Shawming
Pu Bryan
Sung Shing-Li
Wang Judy
Applied Materials Inc.
Ghyka Alexander G
Law Offices of Charles Guenzer
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