Process for treatment of thin films based upon metallic oxide or

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

20419215, 20419223, 20419226, C23C 1434, C23C 1458

Patent

active

055693628

ABSTRACT:
A treatment process for the purpose of improving the chemical and/or physical durability of film containing one or more metallic oxides, nitrides, oxynitrides or oxycarbides deposited on a transparent substrate by a cathodic sputtering technique, notably assisted by a magnetic field and preferably reactive in the presence of oxygen. Said process consists of subjecting the film to a low energy ion beam.

REFERENCES:
patent: 3890109 (1975-06-01), Jones
patent: 4395467 (1983-07-01), Vossen, Jr. et al.
patent: 4793908 (1988-12-01), Scott et al.
patent: 4851095 (1989-07-01), Scobey et al.
patent: 4920094 (1990-04-01), Nogawa et al.
patent: 4933058 (1990-06-01), Bache et al.
patent: 5122252 (1992-06-01), Latz et al.
patent: 5346600 (1994-09-01), Nieh et al.
"Ion Implantation and ion beam processing of materials" Hubler et al., Materials Research Society Symposium Proceedings, vol. 27, pp. 765-770.
Ion Implantation and Ion Beam Processing of Materials, Hublet et al., Materials Research Society Symposia Proceedings, vol. 27, pp. 765-770.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for treatment of thin films based upon metallic oxide or does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for treatment of thin films based upon metallic oxide or, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for treatment of thin films based upon metallic oxide or will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1783624

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.